DocMemory
 
Home
News
Products
Shop
Memory
Corporate
Contact
 

News
Industry News
Publications
CST News
Help/Support
Member Area
Tester Brochure
Demo Library
Software
Tester FAQs

biology medicine news product technology definition

Thursday, April 17, 2014
Memory Industry News
Email ArticlePrinter Format PreviousNext

TI samples Flash memory for extreme enviroment


Wednesday, November 21, 2012

Texas Instruments Inc. has started to sample the industry’s first high-temperature, nonvolatile Flash memory device for extreme environments.

The SM28VLT32-HT has an operational capacity of 4 MB and eliminates the need for costly up-screening and qualification testing of industrial-grade components for temperature ranges outside data sheet specifications.

The device allows data logging at extreme temperatures and is guaranteed for at least 1,000 hours of operating life in harsh extreme environment applications, including oil and gas exploration, heavy industrial, and avionics.

By: DocMemory
Copyright © 2012 CST, Inc. All Rights Reserved

Email ArticlePrinter Format PreviousNext
Latest Industry News
Modular phone priced at $504/17/2014
QDR IV fills niche memory market for networking systems4/17/2014
DRAM prices continue to slide4/17/2014
GE setup prototype factory for smart appliances4/17/2014
Xilinx completed validation on DDR4 memory controller4/16/2014
Fujitsu and Panasonic chip operations to combine4/16/2014
New architecture packs 100GbE memory4/16/2014
Amazon to enter market with 3D smartphone4/16/2014
Graphene - the wonder material for new semiconductors4/15/2014
Heartbleed can reach into areas not awared4/15/2014

CST Inc. Memory Tester DDR Tester
Copyright © 1994 - 2014 CST, Inc. All Rights Reserved