DocMemory
 
Home
News
Products
Shop
Memory
Corporate
Contact
 

News
Industry News
Publications
CST News
Help/Support
Member Area
Tester Brochure
Demo Library
Software
Tester FAQs

biology medicine news product technology definition

Monday, October 20, 2014
Memory Industry News
Email ArticlePrinter Format PreviousNext

TI samples Flash memory for extreme enviroment


Wednesday, November 21, 2012

Texas Instruments Inc. has started to sample the industry’s first high-temperature, nonvolatile Flash memory device for extreme environments.

The SM28VLT32-HT has an operational capacity of 4 MB and eliminates the need for costly up-screening and qualification testing of industrial-grade components for temperature ranges outside data sheet specifications.

The device allows data logging at extreme temperatures and is guaranteed for at least 1,000 hours of operating life in harsh extreme environment applications, including oil and gas exploration, heavy industrial, and avionics.

By: DocMemory
Copyright © 2012 CST, Inc. All Rights Reserved

Email ArticlePrinter Format PreviousNext
Latest Industry News
4G chip prices to drop 30%10/17/2014
U.S. manufacturing output rise10/17/2014
New iPad to feature powerful processor, more memory and better display10/17/2014
AMD to layoff 70010/17/2014
Single LED generates 1400 lumens10/16/2014
European Commission study found solar energy most cost effective source10/16/2014
Intel: Microchip's slump forcast not true10/16/2014
Apple to set image sensor design in Grenoble, France10/16/2014
Samsung insist on no chip price war next year10/15/2014
JPMorgan Chase CEO called for more coordination to fight cyberattacks10/15/2014

CST Inc. Memory Tester DDR Tester
Copyright © 1994 - 2014 CST, Inc. All Rights Reserved