Fix Your Memory Module
 
Home
News
Products
Shop
Memory
Corporate
Contact
 

News
Industry News
Publications
CST News
Help/Support
Member Area
Tester Brochure
Demo Library
Software
Tester FAQs

biology medicine news product technology definition

Sunday, September 21, 2014
Memory Industry News
Email ArticlePrinter Format PreviousNext

TI samples Flash memory for extreme enviroment


Wednesday, November 21, 2012

Texas Instruments Inc. has started to sample the industry’s first high-temperature, nonvolatile Flash memory device for extreme environments.

The SM28VLT32-HT has an operational capacity of 4 MB and eliminates the need for costly up-screening and qualification testing of industrial-grade components for temperature ranges outside data sheet specifications.

The device allows data logging at extreme temperatures and is guaranteed for at least 1,000 hours of operating life in harsh extreme environment applications, including oil and gas exploration, heavy industrial, and avionics.

By: DocMemory
Copyright © 2012 CST, Inc. All Rights Reserved

Email ArticlePrinter Format PreviousNext
Latest Industry News
U.S. companies invested in energy efficiency9/19/2014
Applied Micro takes 64bit ARM to embedded applications9/19/2014
Samsung advanced to 20nm Mobile DRAM production9/19/2014
Alliance supplies low power consumption DDR DRAM9/19/2014
Cree files lawsuit to stop LED infringement9/18/2014
Heartbeat sensor will authenticate your smartphone9/18/2014
Micron introduced new SSD for notebooks9/18/2014
U.S. consumer price down August9/18/2014
US CEO not comfortable to spend yet9/17/2014
Massachusetts high court allows direct sales of Tesla9/17/2014

CST Inc. Memory Tester DDR Tester
Copyright © 1994 - 2014 CST, Inc. All Rights Reserved