Tuesday, July 19, 2011
CST Inc will be demonstrating the new Eureka2 MCP Test system at the 2011 IEEE Nuclear and Space Radiation Effects Conference will be held July 25 - 29 in JW Marriott Las Vegas Resort and Spa.
CST is pleased to introduce the bench top memory test system, the Eureka2, specifically designed for high volume mobile phone manufacturers and engineering laboratories.
The Eureka2 Test System is a MCP Chip tester capable of testing LP-DDR,LP-DDR2,LP-DDR3, NAND/NOR memory chip and it utilizes CST‘s proprietary test algoritium to capture all known memory failures.
The Eureka2 MCP Memory Test system with CST's Proprietary Technology offers a significant advanced programmable features, wide Vdd voltage range setting and high frequency testing up to 1333Mhz data rate.
Some of the Eureka2 MCP Tester Key Features
- Support LP-DDR1, LP-DDR2,LP-DDR3
- Support NAND/NOR Flash Memory
- Fault Focusing algorithm to pin-point bad chips
- Wide Vdd voltage setting for testing DRAM and Flash Memory
- Programmable Timing Adjustment - 50ps resolution
- 7 ~ ICC measurement
- DC Leakage Measurement
- DRAM/Flash Speed Sorting
- CROSS-Talk Check for Signal integrity problems on DRAM/FLash pins
- Extensive JEDEC Device Library
The Eureka2 "MCP" Memory Tester is built to work with the CST Eureka2 base tester, which allows user to swap inter-changeable , DDR3, DDR2 and DDR Test adapter. With a simple push-button and a mouse click, the Eureka2-MCP tester quickly auto-identify and displays the memory size, clock frequency, and speed of the DRAM/FLASH memory chip.
The new “Eureka2 "MCP" Memory tester provides added troubleshooting capability for the present and future MCP memories at affordable prices. It is targeted for OEM manufacturers for Mobile Phone application. It is indeed the fastest tester and the easiest to use in its class.
The Eureka2- MCP Memory tester is available for ordering during the NSREC show and price starts at U$20,000.
Download Eureka2 MCP Memory Tester from this link :
http://www.simmtester.com/page/products/productSpecs/Eureka2%20MCP%20LPDDR%20NAND%20Tester.pdf
Call 972-2412662 for more information. For more information about the show, log on : http://www.nsrec.com/
Founded in 1983, CST develops, market, and support computer memory tester software and hardware. CST pioneered the first low cost SIMM tester in 1985. Since then, CST testers have become the standard for the computer manufacturing industry, holding more than 70% of the market in testers for computer manufacturers and third party SIMM manufacturers. With its product lines of DIMM memory testers and handlers, CST is equipped to handle all aspects of memory testing. CST has a comprehensive line of testers ranging from the low-volume service tester to the high-volume manufacturing needs.
CST, Inc. headquarters in Dallas, Texas, USA also has direct offices in Singapore, California, China as well as global distributors strategically located in Australia, Brazil, Canada, China, France, Germany, Hong Kong, Japan, Korea, Switzerland, Sweden, Taiwan,Israel,Spain,Portugal and the United Kingdom.
By: DocMemory
Copyright © 2011 CST, Inc. All Rights Reserved
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